Use powerful microscopes

UHNF provides a suite of powerful microscopes to inspect microscopic

Top Services

Electron Microscopy

Inspect your samples with up to 800,000X magnification!

Focused Ion Beam

Interact with your sample via probe manipulation, ion beam milling, and ion beam deposition while imaging with up to 800,000X magnification!

Scanning Probe Microscopy

Interact with your sample using atomically sharp probes to characterize topography, piezoelectric properties, magnetic properties, mechanical properties, and more!